Demystify EVM measurements from cm-wave to mm-wave

29 November 2017
14:45 - 15:15

Demystify EVM measurements from cm-wave to mm-wave

EVM is a very important metric to characterize the quality of the constellation of an IQ signal or to characterize the degradation of a constellation caused by a component in a chain. The metric is encompassing a lot of effects and possibly is not only characterizing the signal or device under test but also the measurement equipment. It’s a metric used for low-frequency modulation signals up to mm-wave and further. This talk will help to understand the meaning of the EVM and will help to optimize the measurement setup to measure a meaningful EVM. Examples will be provided to demystify the EVM metric and will highlight the challenges to make this a traceable metric.

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