Challenges of mm-wave OTA test

Jan Fromme
28 November 2019
14:00 - 14:30

Challenges of mm-wave OTA test

The 5G industry continues to develop semiconductor devices that can take greater advantage of the wide channels available at mm-wave frequencies above 24 GHz. Many of these devices come in the form of integrated antenna-in-package (AiP) units that require over-the-air (OTA) test to check for manufacturing defects and determine their performance level. This talk introduces the characteristics and challenges of OTA test, as well as current solutions for fast OTA characterization, validation and manufacturing test.